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The conference begins Monday, July 8, with a one-day Short Course titled “Predicting, Characterizing, and Mitigating SEE in Advanced Semiconductor Technologies.” It is organized by Steve Moss, Aerospace Corporation (retired), and consists of four sections (in five talks) taught by leading experts in their respective fields. The short course is designed to provide a broad overview of Single Event Effects (SEE) topics including an introduction to SEE sources and mechanisms, an overview of established and developing SEE test techniques, and issues therewith, and an introduction to the techniques used and challenges faced in designing for and proving SEE resilience. An extensive set of written notes (provided in a CD or Memory stick) is sure to become a valued technical reference.
The Technical Program will be held from Tuesday, July 9 to Friday, July 12. Simone Gerardin, University of Padova, is the Technical Program Chair. He, along with his technical committee, have chosen an outstanding set of contributed papers organized into 10 sessions of oral presentations and a poster session encompassing papers from all 10 sessions. In addition, the technical committee has selected a set of high quality presentations for the Radiation Effects Data Workshop. Workshop posters will present radiation effects data on electronic and photonic devices and systems, and new simulation or test facilities. Finally, Simone has invited three engaging speakers to give general interest presentations from Wednesday through Friday.
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